Progress in Crystal Growth and Characterization of Materials

Bragg diffraction imaging characterization of crystal defects in GaN (0001) substrates: Comparison of the growth method and the seed approach

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Role of micro-Raman technique in material characterization of GaN wide bandgap semiconductor: Review

Editorial Board

The growth of titanium doped sapphire for laser application

Metastable zone width of different solute-solvent systems during cooling crystallization: Experimental observations and their interpretation